Microstructural Defects of Solar Cells Investigated by a Variety Diagnostics Methods
| but.event.date | 28.04.2016 | cs |
| but.event.title | Student EEICT 2016 | cs |
| dc.contributor.author | Škvarenina, L’ubomír | |
| dc.date.accessioned | 2018-07-10T12:48:22Z | |
| dc.date.available | 2018-07-10T12:48:22Z | |
| dc.date.issued | 2016 | cs |
| dc.description.abstract | This paper discusses the application of a variety diagnostic methods applicable to the solar cells. More objective results about solar cells quality and reliability are possible to obtain by using a various methods. Diagnostic methods described in this paper are based on a dark and illuminated J–V characteristics, a investigation of noise in a wide range of frequency and a radiation detection at a di erent spectral range, namely by an electroluminescence and a thermography method. These methods are primarily more appropriate for a detection or a localization of microstructure defects when a reverse-bias stress is applied. However, the analysis of a forward-bias conditions is included in an investigation of J–V characteristics as well. | en |
| dc.format | text | cs |
| dc.format.extent | 743-747 | cs |
| dc.format.mimetype | application/pdf | en |
| dc.identifier.citation | Proceedings of the 22nd Conference STUDENT EEICT 2016. s. 743-747. ISBN 978-80-214-5350-0 | cs |
| dc.identifier.isbn | 978-80-214-5350-0 | |
| dc.identifier.uri | http://hdl.handle.net/11012/84031 | |
| dc.language.iso | en | cs |
| dc.publisher | Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
| dc.relation.ispartof | Proceedings of the 22nd Conference STUDENT EEICT 2016 | en |
| dc.relation.uri | http://www.feec.vutbr.cz/EEICT/ | cs |
| dc.rights | © Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
| dc.rights.access | openAccess | en |
| dc.subject | Solar Cells | en |
| dc.subject | J–V curve | en |
| dc.subject | Noise | en |
| dc.subject | Electroluminescence | en |
| dc.subject | Thermal Imaging | en |
| dc.subject | Defects | en |
| dc.title | Microstructural Defects of Solar Cells Investigated by a Variety Diagnostics Methods | en |
| dc.type.driver | conferenceObject | en |
| dc.type.status | Peer-reviewed | en |
| dc.type.version | publishedVersion | en |
| eprints.affiliatedInstitution.department | Fakulta elektrotechniky a komunikačních technologií | cs |
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