Measurement-Based Domain Parameter Optimization in Electrical Impedance Tomography Imaging

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dc.contributor.authorDušek, Jancs
dc.contributor.authorMikulka, Jancs
dc.coverage.issue7cs
dc.coverage.volume21cs
dc.date.accessioned2021-04-13T14:55:11Z
dc.date.available2021-04-13T14:55:11Z
dc.date.issued2021-04-03cs
dc.description.abstractThis paper discusses the optimization of domain parameters in electrical impedance tomography-based imaging. Precise image reconstruction requires accurate, well-correlated physical and numerical finite element method (FEM) models; thus, we employed the Nelder–Mead algorithm and a complete electrode model to evaluate the individual parameters, including the initial conductivity, electrode misplacement, and shape deformation. The optimization process was designed to calculate the parameters of the numerical model before the image reconstruction. The models were verified via simulation and experimental measurement with single source current patterns. The impact of the optimization on the above parameters was reflected in the applied image reconstruction process, where the conductivity error dropped by 6.16% and 11.58% in adjacent and opposite driving, respectively. In the shape deformation, the inhomogeneity area ratio increased by 11.0% and 48.9%; the imprecise placement of the 6th electrode was successfully optimized with adjacent driving; the conductivity error dropped by 12.69%; and the inhomogeneity localization exhibited a rise of 66.7%. The opposite driving option produces undesired duality resulting from the measurement pattern. The designed optimization process proved to be suitable for correlating the numerical and the physical models, and it also enabled us to eliminate imaging uncertainties and artifacts.en
dc.formattextcs
dc.format.extent1-20cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationSENSORS. 2021, vol. 21, issue 7, p. 1-20.en
dc.identifier.doi10.3390/s21072507cs
dc.identifier.issn1424-8220cs
dc.identifier.other171079cs
dc.identifier.urihttp://hdl.handle.net/11012/196501
dc.language.isoencs
dc.publisherMDPIcs
dc.relation.ispartofSENSORScs
dc.relation.urihttps://www.mdpi.com/1424-8220/21/7/2507/htmcs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1424-8220/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectelectrical impedance tomographyen
dc.subjectNelder-Mead optimizationen
dc.subjectelectrode locationsen
dc.subjectdomain deformationen
dc.subjectcomplete electrode modelen
dc.titleMeasurement-Based Domain Parameter Optimization in Electrical Impedance Tomography Imagingen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-171079en
sync.item.dbtypeVAVen
sync.item.insts2021.05.10 00:55:48en
sync.item.modts2021.05.10 00:15:58en
thesis.grantorVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav teoretické a experimentální elektrotechnikycs
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