An Automated ESD Model Characterization Method
dc.contributor.author | Napravnik, Tomas | |
dc.contributor.author | Jakovenko, Jiri | |
dc.coverage.issue | 3 | cs |
dc.coverage.volume | 27 | cs |
dc.date.accessioned | 2018-11-23T09:26:52Z | |
dc.date.available | 2018-11-23T09:26:52Z | |
dc.date.issued | 2018-09 | cs |
dc.description.abstract | Novel automated simulator-independent ESD model characterization method based on Differential evolution and Nelder-Mead Simplex algorithms is presented in this paper. It offers an alternative for time and human-resources demanding manual characterization that is still widely used. The paper also presents stable models of the four most often used snapback-based protection devices in CMOS technologies, i.e., NMOST and three variants of silicon-controlled rectifier structure. These models were used for evaluation of the proposed method and the results are included and discussed. | en |
dc.format | text | cs |
dc.format.extent | 784-795 | cs |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Radioengineering. 2018 vol. 27, č. 3, s. 784-795. ISSN 1210-2512 | cs |
dc.identifier.doi | 10.13164/re.2018.0784 | en |
dc.identifier.issn | 1210-2512 | |
dc.identifier.uri | http://hdl.handle.net/11012/137037 | |
dc.language.iso | en | cs |
dc.publisher | Společnost pro radioelektronické inženýrství | cs |
dc.relation.ispartof | Radioengineering | cs |
dc.relation.uri | https://www.radioeng.cz/fulltexts/2018/18_03_0784_0795.pdf | cs |
dc.rights | Creative Commons Attribution 4.0 International license | en |
dc.rights.access | openAccess | en |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | en |
dc.subject | ESD | en |
dc.subject | automated model calibration | en |
dc.subject | differential evolution | en |
dc.subject | Nelder-Mead simplex | en |
dc.subject | I-V characteristic | en |
dc.title | An Automated ESD Model Characterization Method | en |
dc.type.driver | article | en |
dc.type.status | Peer-reviewed | en |
dc.type.version | publishedVersion | en |
eprints.affiliatedInstitution.faculty | Fakulta eletrotechniky a komunikačních technologií | cs |
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