An Automated ESD Model Characterization Method

dc.contributor.authorNapravnik, Tomas
dc.contributor.authorJakovenko, Jiri
dc.coverage.issue3cs
dc.coverage.volume27cs
dc.date.accessioned2018-11-23T09:26:52Z
dc.date.available2018-11-23T09:26:52Z
dc.date.issued2018-09cs
dc.description.abstractNovel automated simulator-independent ESD model characterization method based on Differential evolution and Nelder-Mead Simplex algorithms is presented in this paper. It offers an alternative for time and human-resources demanding manual characterization that is still widely used. The paper also presents stable models of the four most often used snapback-based protection devices in CMOS technologies, i.e., NMOST and three variants of silicon-controlled rectifier structure. These models were used for evaluation of the proposed method and the results are included and discussed.en
dc.formattextcs
dc.format.extent784-795cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRadioengineering. 2018 vol. 27, č. 3, s. 784-795. ISSN 1210-2512cs
dc.identifier.doi10.13164/re.2018.0784en
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/137037
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttps://www.radioeng.cz/fulltexts/2018/18_03_0784_0795.pdfcs
dc.rightsCreative Commons Attribution 4.0 International licenseen
dc.rights.accessopenAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.subjectESDen
dc.subjectautomated model calibrationen
dc.subjectdifferential evolutionen
dc.subjectNelder-Mead simplexen
dc.subjectI-V characteristicen
dc.titleAn Automated ESD Model Characterization Methoden
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
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