The Imaging Of A Schock Wave Within A Supersoniclow-Pressure Gas Flow Using Opticalmethods

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but.event.date27.04.2017cs
but.event.titleStudent EEICT 2017cs
dc.contributor.authorBayer, Robert
dc.date.accessioned2020-05-07T09:40:31Z
dc.date.available2020-05-07T09:40:31Z
dc.date.issued2017cs
dc.description.abstractUsing Environmental Scanning Electron Microscope (ESEM), which uses high gas pressure within the specimen chamber instead of vacuum, allows us to study samples containing water, samples with high capacity and live biological samples. It is because of the lack of the need to freeze the sample to sublimate the water from it. However, the behavior of the pumped gas in low pressures is not well mapped to be the low-pressure gas flow simulations considered adequately precise for applying on ESEM. To increase the precision of simulations, it is possible to use optical methods for imaging the shock wave within the differentially pumped chamber because of its uniqueness.en
dc.formattextcs
dc.format.extent501-505cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings of the 23st Conference STUDENT EEICT 2017. s. 501-505. ISBN 978-80-214-5496-5cs
dc.identifier.isbn978-80-214-5496-5
dc.identifier.urihttp://hdl.handle.net/11012/187154
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings of the 23st Conference STUDENT EEICT 2017en
dc.relation.urihttp://www.feec.vutbr.cz/EEICT/cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectANSYS Fluenten
dc.subjectElectron microscopyen
dc.subjectEnvironmental scanning electron microscopeen
dc.subjectESEMen
dc.subjectOptical methodsen
dc.subjectShadowgraphen
dc.subjectSchlieren methoden
dc.subjectShock waveen
dc.subjectSolidWorksen
dc.titleThe Imaging Of A Schock Wave Within A Supersoniclow-Pressure Gas Flow Using Opticalmethodsen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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