Microcode-Controlled Ram Bist

but.event.date	27.04.2017	cs
but.event.title	Student EEICT 2017	cs
dc.contributor.author	Lukáš, Vykydal
dc.date.accessioned	2020-05-07T09:40:28Z
dc.date.available	2020-05-07T09:40:28Z
dc.date.issued	2017	cs
dc.description.abstract	This paper deals with memory testing principles, focusing mainly on March algorithms. It describes their usage on word based memories. In second part it proposes small programmable BIST controller that can be used in digital circuits.	en
dc.format	text	cs
dc.format.extent	236-238	cs
dc.format.mimetype	application/pdf	en
dc.identifier.citation	Proceedings of the 23st Conference STUDENT EEICT 2017. s. 236-238. ISBN 978-80-214-5496-5	cs
dc.identifier.isbn	978-80-214-5496-5
dc.identifier.uri	http://hdl.handle.net/11012/187093
dc.language.iso	cs	cs
dc.publisher	Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií	cs
dc.relation.ispartof	Proceedings of the 23st Conference STUDENT EEICT 2017	en
dc.relation.uri	http://www.feec.vutbr.cz/EEICT/	cs
dc.rights	© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií	cs
dc.rights.access	openAccess	en
dc.subject	memory testing	en
dc.subject	March algorithms	en
dc.subject	memory BIST	en
dc.subject	counters	en
dc.title	Microcode-Controlled Ram Bist	en
dc.type.driver	conferenceObject	en
dc.type.status	Peer-reviewed	en
dc.type.version	publishedVersion	en
eprints.affiliatedInstitution.department	Fakulta elektrotechniky a komunikačních technologií	cs

Now showing 1 - 1 of 1