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dc.contributor.authorNovotný, Václav
dc.contributor.authorVala, Radek
dc.date.accessioned2020-05-07T09:40:32Z
dc.date.available2020-05-07T09:40:32Z
dc.date.issued2017cs
dc.identifier.citationProceedings of the 23st Conference STUDENT EEICT 2017. s. 537-541. ISBN 978-80-214-5496-5cs
dc.identifier.isbn978-80-214-5496-5
dc.identifier.urihttp://hdl.handle.net/11012/187161
dc.description.abstractThis paper is focused on the area of current electrical manufactory in conjunction with possibilities of computer analysis and monitoring psychical phenomena by computing systems. There are also described processes of preparation and manufactory of testing boards for evaluation of reliability of solder joints on specific microelectronic part which has its place in contemporary electronic production and subsequent analysis of physical processes on these boards under condition of thermal cycling in thermal chamber and their influences on overall reliability of the entire component. For purposes of analysis were chosen SMD resistor arrays in configuration 8x0603 which were soldered on typical substrate FR-4 by SAC305 solder. These soldered resistor arrays are also modeled in Solidworks and analyzed by ANSYS. The results achieved by experimental measurement are complemented by simulations of models.en
dc.formattextcs
dc.format.extent537-541cs
dc.format.mimetypeapplication/pdfen
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings of the 23st Conference STUDENT EEICT 2017en
dc.relation.urihttp://www.feec.vutbr.cz/EEICT/cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.subjectResistoren
dc.subjectArraysen
dc.subjectSolderen
dc.subjectJointen
dc.subjectReliabilityen
dc.subjectSAC305en
dc.subjectANSYSen
dc.subjectCyclingen
dc.titleThe Analysis Of Ceramic Resistor Arrays In Smten
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
but.event.date27.04.2017cs
but.event.titleStudent EEICT 2017cs
dc.rights.accessopenAccessen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen


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