Calcium and fluorine signals in HS-LEIS for CaF2(111) and powder-Quantification of atomic surface concentrations using LiF(001), Ca, and Cu references

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dc.contributor.authorPrůša, Stanislavcs
dc.contributor.authorBábík, Pavelcs
dc.contributor.authorMach, Jindřichcs
dc.contributor.authorStrapko, Tomášcs
dc.contributor.authorŠikola, Tomášcs
dc.contributor.authorBrongersma, Hidde H.cs
dc.coverage.issue2cs
dc.coverage.volume27cs
dc.date.accessioned2020-11-25T15:54:35Z
dc.date.available2020-11-25T15:54:35Z
dc.date.issued2020-12-01cs
dc.description.abstractThe powder of CaF2 has been proposed as a practical reference for the quantitation of Ca and F in low energy ion scattering (LEIS) analysis. It is chemically inert, easy to clean, and inexpensive. LEIS is extremely surface sensitive. Thus, in contrast to surface analytic techniques such as x-ray photoelectron spectroscopy and secondary ion mass spectroscopy, the surface termination of a sample is clearly reflected in the LEIS results. It is, thus, unlikely that in LEIS, the F/Ca ratio for CaF2 is 2.0. This paper supports the reliability of the CaF2 powder reference by evaluating the calcium and fluorine atomic surface concentrations, roughness factor and shows that the surface termination of the powder is the same as that of CaF2(111). The CaF2 samples are treated by annealing at 725 K and measured at 625 K. The presented spectra are practically free of contamination. Ion scattering by LiF (001), an evaporated Ca layer, and a Cu foil are used as basic references for Ca and F. The atomic sensitivity factors and the relative sensitivity factors have been determined for F, Ca, and Cu (3 keV He+, 145 degrees). The F/Ca atomic ratio is found to be the same (2.3 +/- 0.1) for CaF2(111) and its powder. For the powder, the Ca and F signals are reduced by a factor of 0.77 +/- 0.03 in comparison with those for the single crystal.en
dc.formattextcs
dc.format.extent1-13cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationSurface Science Spectra. 2020, vol. 27, issue 2, p. 1-13.en
dc.identifier.doi10.1116/6.0000325cs
dc.identifier.issn1055-5269cs
dc.identifier.other166071cs
dc.identifier.urihttp://hdl.handle.net/11012/195694
dc.language.isoencs
dc.publisherAIP Publishingcs
dc.relation.ispartofSurface Science Spectracs
dc.relation.urihttps://avs.scitation.org/doi/pdf/10.1116/6.0000325cs
dc.rights(C) AIP Publishingcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1055-5269/cs
dc.subjecthigh-sensitivity low energy ion scatteringen
dc.subjectHS-LEISen
dc.subjectISSen
dc.subjectcalcium fluorideen
dc.subjectCaF2en
dc.subjectlithium fluorideen
dc.subjectLiF(001)en
dc.subjectcalciumen
dc.subjectCaen
dc.subjectcopperen
dc.subjectCuen
dc.titleCalcium and fluorine signals in HS-LEIS for CaF2(111) and powder-Quantification of atomic surface concentrations using LiF(001), Ca, and Cu referencesen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionacceptedVersionen
sync.item.dbidVAV-166071en
sync.item.dbtypeVAVen
sync.item.insts2021.03.09 12:54:52en
sync.item.modts2021.03.09 12:15:14en
thesis.grantorVysoké učení technické v Brně. Fakulta strojního inženýrství. Ústav fyzikálního inženýrstvícs
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Příprava a charakterizace nanostrukturcs
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Ústav fyzikálního inženýrství
Příprava a charakterizace nanostruktur