Silicon Solar Cell Parameters Change After Focused Ion Beam Milling

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but.event.date27.04.2017cs
but.event.titleStudent EEICT 2017cs
dc.contributor.authorGajdos, Adam
dc.date.accessioned2020-05-07T09:40:34Z
dc.date.available2020-05-07T09:40:34Z
dc.date.issued2017cs
dc.description.abstractSilicon is still one of the most used materials for fabrication of solar cells. Some imperfections and defects may appear during production process. These local imperfections could be eliminated by focused ion beam (FIB). Nevertheless, FIB milling process modifies the crystal structure of the material by ions implantation. Samples under investigation are monocrystalline silicon solar cells. The impact of FIB milling is shown and discussed through current-voltage measurement before and after milling process.en
dc.formattextcs
dc.format.extent665-669cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings of the 25st Conference STUDENT EEICT 2019. s. 665-669. ISBN 978-80-214-5735-5cs
dc.identifier.isbn978-80-214-5496-5
dc.identifier.urihttp://hdl.handle.net/11012/187186
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings of the 23st Conference STUDENT EEICT 2017en
dc.relation.urihttp://www.feec.vutbr.cz/EEICT/cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectSiliconen
dc.subjectsolar cellen
dc.subjectfocused ion beamen
dc.subjectI-V curveen
dc.subjectSEMen
dc.titleSilicon Solar Cell Parameters Change After Focused Ion Beam Millingen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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